Fast, Easy, and Direct Analysis

An industrial-grade elemental analysis system for elements from hydrogen to uranium – including light elements that XRF and other methods cannot measure.  Furthermore, a Ph.D. is not required – the Spectrolaser® has configurable calibration and measurement routines that can be used by technicians to generate analysis reports quickly and easily.  Escape time-consuming digestions and experience direct elemental analysis with the Spectrolaser®

The Spectrolaser Rapid Elemental Analysis system

The  Technology

The Spectrolaser is an elemental analysis instrument based on a technique called LIBS (Laser-Induced Breakdown Spectroscopy). It incorporates a high-power laser that induces a bright spark (or plasma) at the surface of the material being analyzed, the light from which is subsequently measured by a unique spectrometer and detection system. The elemental fluorescence is directly related to the concentration of the element in the material being analysed.

Superior analytical features are apparent when the Spectrolaser performance is compared to other technologies capable of elemental analysis. In particular, it is sensitive to a wide range of elements present in materials in addition to key low atomic number elements – such as hydrogen and carbon – which are not detected by alternative techniques. The low sample preparation required for analysis enables a high throughput of samples thereby significantly lowering analysis costs. Analysis times have been reduced to approximately 20 seconds for simultaneous determination of the concentration levels of all the detectable elements, which compares favorably to alternative elemental analysis technologies.

Spectrolaser Features

Rapid analysis (~20 seconds)Little sample preparation

Light element analysis

Quick report generation

Saved calibrations and method files

“Operator” mode runs pre-configured calibrations with no background knowledge needed

Detection limits in 10s of ppm for most elements

Measured detection limits in coal (*as-received basis)

Scanning for Elements in a Sample